Coverart for item
The Resource Testing, reliability, and application of micro- and nano-material systems : 3-5 March, 2003, San Diego, California, USA, Norbert Meyendorf, George Y. Baaklini, Bernd Michel, chairs/editors ; cosponsored by, National Institute of Standards and Technology (USA) ... [et al.] ; cooperating organizations, Institute of Acostic Microscopy (USA) ... [et al.] ; published by SPIE--the International Society for Optical Engineering

Testing, reliability, and application of micro- and nano-material systems : 3-5 March, 2003, San Diego, California, USA, Norbert Meyendorf, George Y. Baaklini, Bernd Michel, chairs/editors ; cosponsored by, National Institute of Standards and Technology (USA) ... [et al.] ; cooperating organizations, Institute of Acostic Microscopy (USA) ... [et al.] ; published by SPIE--the International Society for Optical Engineering

Label
Testing, reliability, and application of micro- and nano-material systems : 3-5 March, 2003, San Diego, California, USA
Title
Testing, reliability, and application of micro- and nano-material systems
Title remainder
3-5 March, 2003, San Diego, California, USA
Statement of responsibility
Norbert Meyendorf, George Y. Baaklini, Bernd Michel, chairs/editors ; cosponsored by, National Institute of Standards and Technology (USA) ... [et al.] ; cooperating organizations, Institute of Acostic Microscopy (USA) ... [et al.] ; published by SPIE--the International Society for Optical Engineering
Contributor
Subject
Genre
Language
eng
Member of
Cataloging source
LHL
Illustrations
illustrations
Index
index present
Literary form
non fiction
Nature of contents
bibliography
http://library.link/vocab/relatedWorkOrContributorDate
1949-
http://library.link/vocab/relatedWorkOrContributorName
  • Meyendorf, Norbert
  • Baaklini, George Y
  • Michel, Bernd
  • National Institute of Standards and Technology (U.S.)
  • Institute of Acoustic Microscopy (U.S.)
  • Society of Photo-optical Instrumentation Engineers
Series statement
SPIE proceedings series,
Series volume
v. 5045
http://library.link/vocab/subjectName
  • Electrooptical devices
  • Photonics
  • Nanostructured materials
  • Microelectromechanical systems
Label
Testing, reliability, and application of micro- and nano-material systems : 3-5 March, 2003, San Diego, California, USA, Norbert Meyendorf, George Y. Baaklini, Bernd Michel, chairs/editors ; cosponsored by, National Institute of Standards and Technology (USA) ... [et al.] ; cooperating organizations, Institute of Acostic Microscopy (USA) ... [et al.] ; published by SPIE--the International Society for Optical Engineering
Instantiates
Publication
Note
"SPIE is an international technical society dedicated to advancing engineering and scientific applications of optical, photonic, imaging, electronic, and optoelectronic technologies."
Bibliography note
Includes bibliographical references and index
Dimensions
28 cm.
Extent
ix, 276 p.
Isbn
9780819448507
Other physical details
ill.
System control number
  • 2034429-01okla_normanlaw
  • (SIRSI)2034429
  • (Sirsi) o52852709
  • (OCoLC)52852709
Label
Testing, reliability, and application of micro- and nano-material systems : 3-5 March, 2003, San Diego, California, USA, Norbert Meyendorf, George Y. Baaklini, Bernd Michel, chairs/editors ; cosponsored by, National Institute of Standards and Technology (USA) ... [et al.] ; cooperating organizations, Institute of Acostic Microscopy (USA) ... [et al.] ; published by SPIE--the International Society for Optical Engineering
Publication
Note
"SPIE is an international technical society dedicated to advancing engineering and scientific applications of optical, photonic, imaging, electronic, and optoelectronic technologies."
Bibliography note
Includes bibliographical references and index
Dimensions
28 cm.
Extent
ix, 276 p.
Isbn
9780819448507
Other physical details
ill.
System control number
  • 2034429-01okla_normanlaw
  • (SIRSI)2034429
  • (Sirsi) o52852709
  • (OCoLC)52852709

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