Coverart for item
The Resource Nondestructive evaluation and reliability of micro- and nanomaterial systems : 18-19 March 2002, Newport Beach, USA, Norbert Meyendorf, George Y. Baaklini, Bernd Michel, chairs/editors ; sponsored ... by SPIE--the International Society for Optical Engineering

Nondestructive evaluation and reliability of micro- and nanomaterial systems : 18-19 March 2002, Newport Beach, USA, Norbert Meyendorf, George Y. Baaklini, Bernd Michel, chairs/editors ; sponsored ... by SPIE--the International Society for Optical Engineering

Label
Nondestructive evaluation and reliability of micro- and nanomaterial systems : 18-19 March 2002, Newport Beach, USA
Title
Nondestructive evaluation and reliability of micro- and nanomaterial systems
Title remainder
18-19 March 2002, Newport Beach, USA
Statement of responsibility
Norbert Meyendorf, George Y. Baaklini, Bernd Michel, chairs/editors ; sponsored ... by SPIE--the International Society for Optical Engineering
Contributor
Subject
Genre
Language
eng
Member of
Cataloging source
CUS
Illustrations
illustrations
Index
index present
Literary form
non fiction
Nature of contents
bibliography
http://library.link/vocab/relatedWorkOrContributorName
  • Meyendorf, Norbert
  • Baaklini, George Y
  • Michel, Bernd
  • Society of Photo-optical Instrumentation Engineers
Series statement
SPIE proceedings series,
Series volume
v. 4703
http://library.link/vocab/subjectName
  • Nanostructured materials
  • Microelectromechanical systems
  • Microelectromechanical systems
  • Nondestructive testing
  • Surfaces (Technology)
  • Quality control
Label
Nondestructive evaluation and reliability of micro- and nanomaterial systems : 18-19 March 2002, Newport Beach, USA, Norbert Meyendorf, George Y. Baaklini, Bernd Michel, chairs/editors ; sponsored ... by SPIE--the International Society for Optical Engineering
Instantiates
Publication
Note
"SPIE is an international technical society dedicated to advancing engineering and scientific applications of optical, photonic, imaging, electronic, and optoelectronic technologies."-- T.p
Bibliography note
Includes bibliographical references and index
Dimensions
28 cm.
Extent
ix, 228 p.
Isbn
9780819444516
Other physical details
ill.
System control number
  • 1931221-01okla_normanlaw
  • (SIRSI)1931221
  • (Sirsi) o50326042
  • (OCoLC)50326042
Label
Nondestructive evaluation and reliability of micro- and nanomaterial systems : 18-19 March 2002, Newport Beach, USA, Norbert Meyendorf, George Y. Baaklini, Bernd Michel, chairs/editors ; sponsored ... by SPIE--the International Society for Optical Engineering
Publication
Note
"SPIE is an international technical society dedicated to advancing engineering and scientific applications of optical, photonic, imaging, electronic, and optoelectronic technologies."-- T.p
Bibliography note
Includes bibliographical references and index
Dimensions
28 cm.
Extent
ix, 228 p.
Isbn
9780819444516
Other physical details
ill.
System control number
  • 1931221-01okla_normanlaw
  • (SIRSI)1931221
  • (Sirsi) o50326042
  • (OCoLC)50326042

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