The Resource High-Resolution X-Ray Scattering : From Thin Films to Lateral Nanostructures, by Ullrich Pietsch, Václav Holý, Tilo Baumbach, (electronic resource)

High-Resolution X-Ray Scattering : From Thin Films to Lateral Nanostructures, by Ullrich Pietsch, Václav Holý, Tilo Baumbach, (electronic resource)

Label
High-Resolution X-Ray Scattering : From Thin Films to Lateral Nanostructures
Title
High-Resolution X-Ray Scattering
Title remainder
From Thin Films to Lateral Nanostructures
Statement of responsibility
by Ullrich Pietsch, Václav Holý, Tilo Baumbach
Creator
Contributor
Subject
Genre
Language
eng
Summary
The book presents a detailed description of high-resolution x-ray scattering methods suitable for the investigation of the real structure of single-crystalline layers and multilayers, including structure defects in the layers and at the interfaces. Particular attention is devoted to lateral structures in semiconductors and semiconductor multilayers such as quantum wires and quantum dots. Both the theoretical background and the application of the methods are discussed. The second edition is extended to deal with lateral surface nanostructures such as gratings and dots, new examples for measuring layer thickness, lattice mismatch, and surface/interface roughness. The book will be an invaluable source for graduates and scientists
Member of
Cataloging source
AU@
http://library.link/vocab/creatorName
Pietsch, Ulrich
Dewey number
620.44
Index
no index present
LC call number
  • TA418.7-418.76
  • TA418.9.T45
Literary form
non fiction
Nature of contents
dictionaries
http://library.link/vocab/relatedWorkOrContributorName
  • Holý, Václav
  • Baumbach, Tilo
Series statement
Advanced Texts in Physics,
http://library.link/vocab/subjectName
  • Optical materials
  • Nanotechnology
  • Surfaces (Physics)
  • Nanotechnology
  • Optical materials
  • Surfaces (Physics)
Label
High-Resolution X-Ray Scattering : From Thin Films to Lateral Nanostructures, by Ullrich Pietsch, Václav Holý, Tilo Baumbach, (electronic resource)
Link
http://dx.doi.org/10.1007/978-1-4757-4050-9
Instantiates
Publication
Antecedent source
file reproduced from original
Carrier category
online resource
Carrier category code
  • cr
Carrier MARC source
rdacarrier
Color
mixed
Content category
text
Content type code
  • txt
Content type MARC source
rdacontent
Contents
Part I. Experimental Realization: Elements for Designing an X-Ray Diffraction Experiment; Diffractometers and Reflectometers; Scans and Resolution in Angular and Reciprocal Space -- Part II. Basic Principles: Basic Principles; Kinematic Theory; Dynamical Theory; Semikinematic Theory -- Part III. Determination of Layer Thicknesses of Single Layers and Multilayers: Lattice Parameters and Lattice Strains in Single Epitaxial Layers and Multilayers; Diffuse Scattering from Volume Defects in Thin Layers; X-Ray Scattering by Rough Multilayers -- Part IV. X-Ray Scattering by Laterally Constructed Semiconductor Nanostructures: X-Ray Scattering by Artificially Lateral Semiconductor Nanostructures; Strain Analysis in Periodic Nanostructures; X-Ray Scattering from Self-Organized Structures -- References -- Index
Dimensions
unknown
Edition
Second edition.
Extent
1 online resource (xvi, 408 pages).
File format
unknown
Form of item
online
Isbn
9781475740509
Isbn Type
(electronic bk.)
Level of compression
uncompressed
Media category
computer
Media MARC source
rdamedia
Media type code
  • c
Other control number
10.1007/978-1-4757-4050-9
Quality assurance targets
unknown
Reformatting quality
access
Sound
unknown sound
Specific material designation
remote
System control number
  • (OCoLC)851754099
  • (OCoLC)ocn851754099
Label
High-Resolution X-Ray Scattering : From Thin Films to Lateral Nanostructures, by Ullrich Pietsch, Václav Holý, Tilo Baumbach, (electronic resource)
Link
http://dx.doi.org/10.1007/978-1-4757-4050-9
Publication
Antecedent source
file reproduced from original
Carrier category
online resource
Carrier category code
  • cr
Carrier MARC source
rdacarrier
Color
mixed
Content category
text
Content type code
  • txt
Content type MARC source
rdacontent
Contents
Part I. Experimental Realization: Elements for Designing an X-Ray Diffraction Experiment; Diffractometers and Reflectometers; Scans and Resolution in Angular and Reciprocal Space -- Part II. Basic Principles: Basic Principles; Kinematic Theory; Dynamical Theory; Semikinematic Theory -- Part III. Determination of Layer Thicknesses of Single Layers and Multilayers: Lattice Parameters and Lattice Strains in Single Epitaxial Layers and Multilayers; Diffuse Scattering from Volume Defects in Thin Layers; X-Ray Scattering by Rough Multilayers -- Part IV. X-Ray Scattering by Laterally Constructed Semiconductor Nanostructures: X-Ray Scattering by Artificially Lateral Semiconductor Nanostructures; Strain Analysis in Periodic Nanostructures; X-Ray Scattering from Self-Organized Structures -- References -- Index
Dimensions
unknown
Edition
Second edition.
Extent
1 online resource (xvi, 408 pages).
File format
unknown
Form of item
online
Isbn
9781475740509
Isbn Type
(electronic bk.)
Level of compression
uncompressed
Media category
computer
Media MARC source
rdamedia
Media type code
  • c
Other control number
10.1007/978-1-4757-4050-9
Quality assurance targets
unknown
Reformatting quality
access
Sound
unknown sound
Specific material designation
remote
System control number
  • (OCoLC)851754099
  • (OCoLC)ocn851754099

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