The Resource Frontiers in optical methods : nano-characterization and coherent control, Ken-ichi Shudo, Ikufumui Katayama, Shin-Ya Ohno, editors

Frontiers in optical methods : nano-characterization and coherent control, Ken-ichi Shudo, Ikufumui Katayama, Shin-Ya Ohno, editors

Label
Frontiers in optical methods : nano-characterization and coherent control
Title
Frontiers in optical methods
Title remainder
nano-characterization and coherent control
Statement of responsibility
Ken-ichi Shudo, Ikufumui Katayama, Shin-Ya Ohno, editors
Contributor
Editor
Subject
Genre
Language
eng
Summary
This collection of reviews by leading Japanese researchers covers topics like ultrafast optical responses, terahertz and phonon studies, super-sensitive surface and high-pressure spectroscopy, combination of visible and x-ray photonics. Several related areas at the cutting edge of measurement technology and materials science are included. This book is partly based on well-cited review articles in the Japanese language in special volumes of the Journal of the Vacuum Society of Japan
Member of
Cataloging source
GW5XE
Dewey number
535.8/4
Illustrations
illustrations
Index
index present
LC call number
QC454.R4
Literary form
non fiction
Nature of contents
  • dictionaries
  • bibliography
http://library.link/vocab/relatedWorkOrContributorDate
1977-
http://library.link/vocab/relatedWorkOrContributorName
  • Shudo, Ken-ichi
  • Katayama, Ikufumui
  • Ohno, Shin-ya
Series statement
Springer Series in Optical Sciences,
Series volume
180
http://library.link/vocab/subjectName
  • Reflectance spectroscopy
  • Terahertz spectroscopy
  • Coherence (Optics)
  • Physique
  • Astronomie
  • Coherence (Optics)
  • Reflectance spectroscopy
  • Terahertz spectroscopy
  • Engineering & Applied Sciences
  • Applied Physics
  • Physics
  • Optics, Lasers, Photonics, Optical Devices
  • Atomic, Molecular, Optical and Plasma Physics
  • Spectroscopy and Microscopy
  • Microwaves, RF and Optical Engineering
  • Nanotechnology
Label
Frontiers in optical methods : nano-characterization and coherent control, Ken-ichi Shudo, Ikufumui Katayama, Shin-Ya Ohno, editors
Link
https://ezproxy.lib.ou.edu/login?url=http://link.springer.com/10.1007/978-3-642-40594-5
Instantiates
Publication
Copyright
Antecedent source
unknown
Bibliography note
Includes bibliographical references and index
Carrier category
online resource
Carrier category code
  • cr
Carrier MARC source
rdacarrier
Color
multicolored
Content category
text
Content type code
  • txt
Content type MARC source
rdacontent
Contents
State-of-Art of Terahertz Science and Technology -- Broadband Terahertz Spectroscopy and its Application to the Characterization of Thin Films -- Single Photon Counting and Passive Microscopy of Terahertz Radiation -- Coherent Phonons in Carbon Nanotubes -- Time-resolved X-ray Diffraction Studies of Coherent Lattice Dynamics Using Synchrotron Radiation -- Imaging GHz-THz Acoustic Wave Propagation in Thin Films and Microstructures -- Material Evaluation with Various Optical Measurement Systems: Focusing on Terahertz Spectroscopy -- Ultrafast Excitation and Dynamics Measurements with Intense Ultrashort Laser Pulses: High-Order Harmonic Generation from Aligning Molecules and Surface Nanostructuring -- Real Space Mapping of Exciton Interaction Strength in GaN Films by using Four-Wave-Mixing Technique -- Terahertz Light Source Based on Synchrotron Radiation -- Terahertz Synchrotron Radiation; Optics and Application -- Far-infrared Spectroscopy on Solids under Ultra High Pressures -- Real-time Analysis of Initial Oxidation Process on Si(001) by Means of Surface Differential Reflectance Spectroscopy and Reflectance Difference Spectroscopy
Dimensions
unknown
Extent
1 online resource (xii, 228 pages)
File format
unknown
Form of item
online
Isbn
9783642405938
Level of compression
unknown
Media category
computer
Media MARC source
rdamedia
Media type code
  • c
Note
SpringerLink
Other control number
10.1007/978-3-642-40594-5
Other physical details
illustrations (some color).
Quality assurance targets
not applicable
Reformatting quality
unknown
Sound
unknown sound
Specific material designation
remote
System control number
  • (OCoLC)870683312
  • (OCoLC)ocn870683312
Label
Frontiers in optical methods : nano-characterization and coherent control, Ken-ichi Shudo, Ikufumui Katayama, Shin-Ya Ohno, editors
Link
https://ezproxy.lib.ou.edu/login?url=http://link.springer.com/10.1007/978-3-642-40594-5
Publication
Copyright
Antecedent source
unknown
Bibliography note
Includes bibliographical references and index
Carrier category
online resource
Carrier category code
  • cr
Carrier MARC source
rdacarrier
Color
multicolored
Content category
text
Content type code
  • txt
Content type MARC source
rdacontent
Contents
State-of-Art of Terahertz Science and Technology -- Broadband Terahertz Spectroscopy and its Application to the Characterization of Thin Films -- Single Photon Counting and Passive Microscopy of Terahertz Radiation -- Coherent Phonons in Carbon Nanotubes -- Time-resolved X-ray Diffraction Studies of Coherent Lattice Dynamics Using Synchrotron Radiation -- Imaging GHz-THz Acoustic Wave Propagation in Thin Films and Microstructures -- Material Evaluation with Various Optical Measurement Systems: Focusing on Terahertz Spectroscopy -- Ultrafast Excitation and Dynamics Measurements with Intense Ultrashort Laser Pulses: High-Order Harmonic Generation from Aligning Molecules and Surface Nanostructuring -- Real Space Mapping of Exciton Interaction Strength in GaN Films by using Four-Wave-Mixing Technique -- Terahertz Light Source Based on Synchrotron Radiation -- Terahertz Synchrotron Radiation; Optics and Application -- Far-infrared Spectroscopy on Solids under Ultra High Pressures -- Real-time Analysis of Initial Oxidation Process on Si(001) by Means of Surface Differential Reflectance Spectroscopy and Reflectance Difference Spectroscopy
Dimensions
unknown
Extent
1 online resource (xii, 228 pages)
File format
unknown
Form of item
online
Isbn
9783642405938
Level of compression
unknown
Media category
computer
Media MARC source
rdamedia
Media type code
  • c
Note
SpringerLink
Other control number
10.1007/978-3-642-40594-5
Other physical details
illustrations (some color).
Quality assurance targets
not applicable
Reformatting quality
unknown
Sound
unknown sound
Specific material designation
remote
System control number
  • (OCoLC)870683312
  • (OCoLC)ocn870683312

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