The Resource From scientific instrument to industrial machine : Coping with architectural stress in embedded systems, edited by Richard Doornbos, Sjir van Loo, (electronic resource)

From scientific instrument to industrial machine : Coping with architectural stress in embedded systems, edited by Richard Doornbos, Sjir van Loo, (electronic resource)

Label
From scientific instrument to industrial machine : Coping with architectural stress in embedded systems
Title
From scientific instrument to industrial machine
Title remainder
Coping with architectural stress in embedded systems
Statement of responsibility
edited by Richard Doornbos, Sjir van Loo
Contributor
Editor
Editor
Subject
Language
  • eng
  • eng
Summary
Architectural stress is the inability of a system design to respond to new market demands. It is an important yet often concealed issue in high tech systems. In From scientific instrument to industrial machine, we look at the phenomenon of architectural stress in embedded systems in the context of a transmission electron microscope system built by FEI Company. Traditionally, transmission electron microscopes are manually operated scientific instruments, but they also have enormous potential for use in industrial applications. However, this new market has quite different characteristics. There are strong demands for cost-effective analysis, accurate and precise measurements, and ease-of-use. These demands can be translated into new system qualities, e.g. reliability, predictability and high throughput, as well as new functions, e.g. automation of electron microscopic analyses, automated focusing and positioning functions. From scientific instrument to industrial machine takes a pragmatic approach to the problem of architectural stress. In particular, it describes the outcomes of the Condor project, a joint endeavour by a consortium of industrial and academic partners. In this collaboration an integrated approach was essential to successfully combine various scientific results and show the first steps towards a new direction. System modelling and prototyping were the key techniques to develop better understanding and innovative solutions to the problems associated with architectural stress. From scientific instrument to industrial machine is targeted mainly at industrial practitioners, in particular system architects and engineers working on high tech systems. It can therefore be read without particular knowledge of electron microscope systems or microscopic applications. The book forms a bridge between academic and applied science, and high tech industrial practice. By showing the approaches and solutions developed for the electron microscope, it is hoped that system designers will gain some insights in how to deal with architectural stress in similar challenges in the high tech industry
Member of
Is Subseries of
Dewey number
  • 006.2/2
  • 006.22
http://bibfra.me/vocab/relation/httpidlocgovvocabularyrelatorsedt
  • jwMv7JKTdd4
  • iCe9jLJcqYE
Language note
English
LC call number
  • QC450-467
  • QC718.5.S6
Literary form
non fiction
Nature of contents
dictionaries
http://library.link/vocab/relatedWorkOrContributorName
  • Doornbos, Richard.
  • van Loo, Sjir.
Series statement
SpringerBriefs in Electrical and Computer Engineering,
http://library.link/vocab/subjectName
  • Engineering mathematics
  • Software engineering
  • Computer system performance
  • Spectroscopy and Microscopy
  • Mathematical and Computational Engineering
  • Special Purpose and Application-Based Systems
  • Mathematical Modeling and Industrial Mathematics
  • System Performance and Evaluation
Label
From scientific instrument to industrial machine : Coping with architectural stress in embedded systems, edited by Richard Doornbos, Sjir van Loo, (electronic resource)
Instantiates
Publication
Note
Description based upon print version of record
Bibliography note
Includes bibliographical references
Carrier category
online resource
Carrier category code
cr
Content category
text
Content type code
txt
Contents
Foreword -- Acknowledgements -- Part I Introduction -- 1. The Endeavor -- Part II Architecture -- 2. Systems Architecture -- 3. Feasibility prototyping -- 4. Software architecture -- Part III Automation and control functions -- 5. Applications in automated microscopy -- 6. Focusing control -- 7. Positioning control -- Part IV Conclusion -- 8. Final words -- Appendix. Condor Project Publications
Dimensions
unknown
Edition
1st ed. 2012.
Extent
1 online resource (115 p.)
Form of item
online
Isbn
9789400741478
Media category
computer
Media type code
c
Other control number
10.1007/978-94-007-4147-8
Specific material designation
remote
System control number
  • (CKB)3360000000366289
  • (EBL)973909
  • (OCoLC)793342285
  • (SSID)ssj0000666106
  • (PQKBManifestationID)11404799
  • (PQKBTitleCode)TC0000666106
  • (PQKBWorkID)10664530
  • (PQKB)11501290
  • (DE-He213)978-94-007-4147-8
  • (MiAaPQ)EBC973909
  • (EXLCZ)993360000000366289
Label
From scientific instrument to industrial machine : Coping with architectural stress in embedded systems, edited by Richard Doornbos, Sjir van Loo, (electronic resource)
Publication
Note
Description based upon print version of record
Bibliography note
Includes bibliographical references
Carrier category
online resource
Carrier category code
cr
Content category
text
Content type code
txt
Contents
Foreword -- Acknowledgements -- Part I Introduction -- 1. The Endeavor -- Part II Architecture -- 2. Systems Architecture -- 3. Feasibility prototyping -- 4. Software architecture -- Part III Automation and control functions -- 5. Applications in automated microscopy -- 6. Focusing control -- 7. Positioning control -- Part IV Conclusion -- 8. Final words -- Appendix. Condor Project Publications
Dimensions
unknown
Edition
1st ed. 2012.
Extent
1 online resource (115 p.)
Form of item
online
Isbn
9789400741478
Media category
computer
Media type code
c
Other control number
10.1007/978-94-007-4147-8
Specific material designation
remote
System control number
  • (CKB)3360000000366289
  • (EBL)973909
  • (OCoLC)793342285
  • (SSID)ssj0000666106
  • (PQKBManifestationID)11404799
  • (PQKBTitleCode)TC0000666106
  • (PQKBWorkID)10664530
  • (PQKB)11501290
  • (DE-He213)978-94-007-4147-8
  • (MiAaPQ)EBC973909
  • (EXLCZ)993360000000366289

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