The Resource CMOS test and evaluation : a physical perspective, Manjul Bhushan, Mark B. Ketchen

CMOS test and evaluation : a physical perspective, Manjul Bhushan, Mark B. Ketchen

Label
CMOS test and evaluation : a physical perspective
Title
CMOS test and evaluation
Title remainder
a physical perspective
Statement of responsibility
Manjul Bhushan, Mark B. Ketchen
Creator
Contributor
Subject
Genre
Language
eng
Summary
This book extends test structure applications described in Microelectronic Test StrucU?tures for CMOS Technology (Springer 2011) to digital CMOS product chips. Intended for engineering students and professionals, this book provides a single comprehensive source for evaluating CMOS technology and product test data from a basic knowledge of the physical behavior of the constituent components. Elementary circuits that exhibit key properties of complex CMOS chips are simulated and analyzed, and an integrated view of design, test and characterization is developed. Appropriately designed circuit monitors embedded in the CMOS chip serve to correlate CMOS technology models and circuit design tools to the hardware and also aid in test debug. Impact of silicon process variability, reliability, and power and performance sensitivities to a range of product application conditions are described. Circuit simulations exemplify the methodologies presented, and problems are included at the end of the chapters
Cataloging source
N$T
http://library.link/vocab/creatorName
Bhushan, Manjul
Dewey number
621.381
Index
no index present
LC call number
TK7874
Literary form
non fiction
Nature of contents
dictionaries
http://library.link/vocab/relatedWorkOrContributorName
Ketchen, Mark B
http://library.link/vocab/subjectName
  • System safety
  • Electronics
  • Systems engineering
  • Engineering
  • TECHNOLOGY & ENGINEERING
  • Electronics
  • Engineering
  • System safety
  • Systems engineering
  • Engineering
  • Electronics and Microelectronics, Instrumentation
  • Circuits and Systems
  • Semiconductors
  • Quality Control, Reliability, Safety and Risk
  • Circuits & components
  • Semi-conductors & super-conductors
  • Reliability engineering
  • Electronics engineering
Label
CMOS test and evaluation : a physical perspective, Manjul Bhushan, Mark B. Ketchen
Link
https://ezproxy.lib.ou.edu/login?url=http://link.springer.com/10.1007/978-1-4939-1349-7
Instantiates
Publication
Antecedent source
unknown
Carrier category
online resource
Carrier category code
  • cr
Carrier MARC source
rdacarrier
Color
multicolored
Content category
text
Content type code
  • txt
Content type MARC source
rdacontent
Contents
Introduction -- CMOS Circuit Basics -- CMOS Storage Elements and Synchronous Logic -- IDDQ and Power -- Embedded PVT Monitors -- Variability -- Product Chip Test and Characterization -- Reliability, Burn-In and Guardbands -- Data Analysis and Characterization -- CMOS Metrics and Model Evaluation
Dimensions
unknown
Extent
1 online resource
File format
unknown
Form of item
online
Isbn
9781493913480
Level of compression
unknown
Media category
computer
Media MARC source
rdamedia
Media type code
  • c
Note
SpringerLink
Other control number
10.1007/978-1-4939-1349-7
Quality assurance targets
not applicable
Reformatting quality
unknown
Sound
unknown sound
Specific material designation
remote
System control number
  • (OCoLC)897810230
  • (OCoLC)ocn897810230
Label
CMOS test and evaluation : a physical perspective, Manjul Bhushan, Mark B. Ketchen
Link
https://ezproxy.lib.ou.edu/login?url=http://link.springer.com/10.1007/978-1-4939-1349-7
Publication
Antecedent source
unknown
Carrier category
online resource
Carrier category code
  • cr
Carrier MARC source
rdacarrier
Color
multicolored
Content category
text
Content type code
  • txt
Content type MARC source
rdacontent
Contents
Introduction -- CMOS Circuit Basics -- CMOS Storage Elements and Synchronous Logic -- IDDQ and Power -- Embedded PVT Monitors -- Variability -- Product Chip Test and Characterization -- Reliability, Burn-In and Guardbands -- Data Analysis and Characterization -- CMOS Metrics and Model Evaluation
Dimensions
unknown
Extent
1 online resource
File format
unknown
Form of item
online
Isbn
9781493913480
Level of compression
unknown
Media category
computer
Media MARC source
rdamedia
Media type code
  • c
Note
SpringerLink
Other control number
10.1007/978-1-4939-1349-7
Quality assurance targets
not applicable
Reformatting quality
unknown
Sound
unknown sound
Specific material designation
remote
System control number
  • (OCoLC)897810230
  • (OCoLC)ocn897810230

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