The Resource Atomic force microscopy/scanning tunneling microscopy 2, edited by Samuel H. Cohen and Marcia L. Lightbody, (electronic resource)

Atomic force microscopy/scanning tunneling microscopy 2, edited by Samuel H. Cohen and Marcia L. Lightbody, (electronic resource)

Label
Atomic force microscopy/scanning tunneling microscopy 2
Title
Atomic force microscopy/scanning tunneling microscopy 2
Statement of responsibility
edited by Samuel H. Cohen and Marcia L. Lightbody
Title variation
Atomic force microscopy/scanning tunneling microscopy two
Contributor
Subject
Genre
Language
eng
Summary
This book represents the compilation of papers presented at the second Atomic Force Microscopy/Scanning Tunneling Microscopy (AFM/STM) Symposium, held June 7 to 9, 1994, in Natick, Massachusetts, at Natick Research, Development and Engineering Center, now part ofU.S. Army Soldier Systems Command. As with the 1993 symposium, the 1994 symposium provided a forum where scientists with a common interest in AFM, STM, and other probe microscopies could interact with one another, exchange ideas and explore the possibilities for future collaborations and working relationships. In addition to the scheduled talks and poster sessions, there was an equipment exhibit featuring the newest state-of-the-art AFM/STM microscopes, other probe microscopes, imaging hardware and software, as well as the latest microscope-related and sample preparation accessories. These were all very favorably received by the meeting's attendees. Following opening remarks by Natick's Commander, Colonel Morris E. Price, Jr., and the Technical Director, Dr. Robert W. Lewis, the symposium began with the Keynote Address given by Dr. Michael F. Crommie from Boston University. The agenda was divided into four major sessions. The papers (and posters) presented at the symposium represented a broad spectrum of topics in atomic force microscopy, scanning tunneling microscopy, and other probe microscopies
Cataloging source
NUI
Dewey number
  • 502/.8/2
  • 620.11
Illustrations
illustrations
Image bit depth
0
Index
index present
LC call number
QH212.A78
LC item number
A863 1997eb
Literary form
non fiction
Nature of contents
  • dictionaries
  • bibliography
http://library.link/vocab/relatedWorkOrContributorDate
1994
http://library.link/vocab/relatedWorkOrContributorName
  • Cohen, Samuel H
  • Lightbody, Marcia L
  • U.S. Army Soldier Systems Command, Natick Research, Development, and Engineering Center Atomic Force Microscopy/Scanning Tunneling Microscopy (AFM/STM) Symposium
http://library.link/vocab/subjectName
  • Atomic force microscopy
  • Scanning tunneling microscopy
  • Materials Science
  • Characterization and Evaluation of Materials
  • Biological Microscopy
  • Analytical Chemistry
  • Atomic/Molecular Structure and Spectra
  • Atomic force microscopy
  • Scanning tunneling microscopy
  • Kongreß
  • Kraftmikroskopie
  • Rastertunnelmikroskopie
Label
Atomic force microscopy/scanning tunneling microscopy 2, edited by Samuel H. Cohen and Marcia L. Lightbody, (electronic resource)
Link
http://dx.doi.org/10.1007/978-1-4757-9325-3
Instantiates
Publication
Note
"Proceedings of the Second U.S. Army Soldier Systems Command, Natick Research, Development, and Engineering Center Atomic Force Microscopy/Scanning Tunneling Microscopy (AFM/STM) Symposium, held June 7-9, 1994, in Natick, Massachusetts"--Title page verso
Antecedent source
mixed
Bibliography note
Includes bibliographical references and index
Carrier category
online resource
Carrier category code
  • cr
Carrier MARC source
rdacarrier
Color
not applicable
Content category
text
Content type code
  • txt
Content type MARC source
rdacontent
Contents
Scanned probe microscopy / Michael F. Crommie -- Scanning tunneling microscopy for Very Large-Scale Integration (VLSI) Inspection / Shane Y. Hong -- Scanning tunneling microscopy-based fabrication of nanometer scale structures / Munir H. Nayfeh -- A microscopy for our time / Elinor Solit -- Scanning tunneling microscopy of chemical vapor deposition diamond film growth on highly oriented pyrolytic graphite and silicon / A.F. Aviles [and others] --Scanning tunneling microscopy and atomic force microscopy of chemical-vapor-deposition diamond and diamond-like carbon thin films / T.W. Mercer [and others]
Dimensions
unknown
Extent
1 online resource (ix, 250 pages)
File format
multiple file formats
Form of item
online
Isbn
9781475793253
Isbn Type
(electronic bk.)
Level of compression
uncompressed
Media category
computer
Media MARC source
rdamedia
Media type code
  • c
Other control number
10.1007/978-1-4757-9325-3
Other physical details
illustrations
Quality assurance targets
absent
Reformatting quality
access
Specific material designation
remote
System control number
  • (OCoLC)859586167
  • (OCoLC)ocn859586167
Label
Atomic force microscopy/scanning tunneling microscopy 2, edited by Samuel H. Cohen and Marcia L. Lightbody, (electronic resource)
Link
http://dx.doi.org/10.1007/978-1-4757-9325-3
Publication
Note
"Proceedings of the Second U.S. Army Soldier Systems Command, Natick Research, Development, and Engineering Center Atomic Force Microscopy/Scanning Tunneling Microscopy (AFM/STM) Symposium, held June 7-9, 1994, in Natick, Massachusetts"--Title page verso
Antecedent source
mixed
Bibliography note
Includes bibliographical references and index
Carrier category
online resource
Carrier category code
  • cr
Carrier MARC source
rdacarrier
Color
not applicable
Content category
text
Content type code
  • txt
Content type MARC source
rdacontent
Contents
Scanned probe microscopy / Michael F. Crommie -- Scanning tunneling microscopy for Very Large-Scale Integration (VLSI) Inspection / Shane Y. Hong -- Scanning tunneling microscopy-based fabrication of nanometer scale structures / Munir H. Nayfeh -- A microscopy for our time / Elinor Solit -- Scanning tunneling microscopy of chemical vapor deposition diamond film growth on highly oriented pyrolytic graphite and silicon / A.F. Aviles [and others] --Scanning tunneling microscopy and atomic force microscopy of chemical-vapor-deposition diamond and diamond-like carbon thin films / T.W. Mercer [and others]
Dimensions
unknown
Extent
1 online resource (ix, 250 pages)
File format
multiple file formats
Form of item
online
Isbn
9781475793253
Isbn Type
(electronic bk.)
Level of compression
uncompressed
Media category
computer
Media MARC source
rdamedia
Media type code
  • c
Other control number
10.1007/978-1-4757-9325-3
Other physical details
illustrations
Quality assurance targets
absent
Reformatting quality
access
Specific material designation
remote
System control number
  • (OCoLC)859586167
  • (OCoLC)ocn859586167

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