The Resource Applied Scanning Probe Methods VI : Characterization, edited by Bharat Bhushan, Satoshi Kawata, (electronic resource)

Applied Scanning Probe Methods VI : Characterization, edited by Bharat Bhushan, Satoshi Kawata, (electronic resource)

Label
Applied Scanning Probe Methods VI : Characterization
Title
Applied Scanning Probe Methods VI
Title remainder
Characterization
Statement of responsibility
edited by Bharat Bhushan, Satoshi Kawata
Contributor
Editor
Editor
Subject
Language
  • eng
  • eng
Summary
The scanning probe microscopy ?eld has been rapidly expanding. It is a demanding task to collect a timely overview of this ?eld with an emphasis on technical dev- opments and industrial applications. It became evident while editing Vols. I–IV that a large number of technical and applicational aspects are present and rapidly - veloping worldwide. Considering the success of Vols. I–IV and the fact that further colleagues from leading laboratories were ready to contribute their latest achie- ments, we decided to expand the series with articles touching ?elds not covered in the previous volumes. The response and support of our colleagues were excellent, making it possible to edit another three volumes of the series. In contrast to to- cal conference proceedings, the applied scanning probe methods intend to give an overview of recent developments as a compendium for both practical applications and recent basic research results, and novel technical developments with respect to instrumentation and probes. The present volumes cover three main areas: novel probes and techniques (Vol. V), charactarization (Vol. VI), and biomimetics and industrial applications (Vol. VII). Volume V includes an overview of probe and sensor technologies including integrated cantilever concepts, electrostatic microscanners, low-noise methods and improved dynamic force microscopy techniques, high-resonance dynamic force - croscopy and the torsional resonance method, modelling of tip cantilever systems, scanning probe methods, approaches for elasticity and adhesion measurements on the nanometer scale as well as optical applications of scanning probe techniques based on near?eld Raman spectroscopy and imaging
Member of
Is Subseries of
Dewey number
620.1/1299
http://bibfra.me/vocab/relation/httpidlocgovvocabularyrelatorsedt
  • se7A0x2QwXw
  • rtlRNc8gWN0
Language note
English
LC call number
T174.7
Literary form
non fiction
Nature of contents
dictionaries
http://library.link/vocab/relatedWorkOrContributorName
  • Bhushan, Bharat.
  • Kawata, Satoshi.
Series statement
NanoScience and Technology,
http://library.link/vocab/subjectName
  • Engineering
  • Nanotechnology
  • Surfaces (Physics)
  • Polymers
  • Chemistry, Physical organic
  • Nanotechnology and Microengineering
  • Nanotechnology
  • Surfaces and Interfaces, Thin Films
  • Polymer Sciences
  • Physical Chemistry
  • Solid State Physics
Label
Applied Scanning Probe Methods VI : Characterization, edited by Bharat Bhushan, Satoshi Kawata, (electronic resource)
Instantiates
Publication
Note
Description based upon print version of record
Bibliography note
Includes bibliographical references and index
Carrier category
online resource
Carrier category code
  • cr
Content category
text
Content type code
  • txt
Contents
Scanning Tunneling Microscopy of Physisorbed Monolayers: From Self-Assembly to Molecular Devices -- Tunneling Electron Spectroscopy Towards Chemical Analysis of Single Molecules -- STM Studies on Molecular Assembly at Solid/Liquid Interfaces -- Single-Molecule Studies on Cells and Membranes Using the Atomic Force Microscope -- Atomic Force Microscopy of DNA Structure and Interactions -- Direct Detection of Ligand-Protein Interaction Using AFM -- Dynamic Force Microscopy for Molecular-Scale Investigations of Organic Materials in Various Environments -- Noncontact Atomic Force Microscopy -- Tip-Enhanced Spectroscopy for Nano Investigation of Molecular Vibrations -- Investigating Individual Carbon Nanotube/Polymer Interfaces with Scanning Probe Microscopy
Dimensions
unknown
Edition
1st ed. 2007.
Extent
1 online resource (378 p.)
Form of item
online
Isbn
9783540373193
Media category
computer
Media type code
  • c
Other control number
10.1007/11776314
Specific material designation
remote
System control number
  • (CKB)1000000000284167
  • (EBL)603603
  • (OCoLC)84895503
  • (SSID)ssj0000768118
  • (PQKBManifestationID)12387796
  • (PQKBTitleCode)TC0000768118
  • (PQKBWorkID)10758410
  • (PQKB)11517815
  • (SSID)ssj0000316289
  • (PQKBManifestationID)11246730
  • (PQKBTitleCode)TC0000316289
  • (PQKBWorkID)10263470
  • (PQKB)11755713
  • (DE-He213)978-3-540-37319-3
  • (MiAaPQ)EBC603603
  • (EXLCZ)991000000000284167
Label
Applied Scanning Probe Methods VI : Characterization, edited by Bharat Bhushan, Satoshi Kawata, (electronic resource)
Publication
Note
Description based upon print version of record
Bibliography note
Includes bibliographical references and index
Carrier category
online resource
Carrier category code
  • cr
Content category
text
Content type code
  • txt
Contents
Scanning Tunneling Microscopy of Physisorbed Monolayers: From Self-Assembly to Molecular Devices -- Tunneling Electron Spectroscopy Towards Chemical Analysis of Single Molecules -- STM Studies on Molecular Assembly at Solid/Liquid Interfaces -- Single-Molecule Studies on Cells and Membranes Using the Atomic Force Microscope -- Atomic Force Microscopy of DNA Structure and Interactions -- Direct Detection of Ligand-Protein Interaction Using AFM -- Dynamic Force Microscopy for Molecular-Scale Investigations of Organic Materials in Various Environments -- Noncontact Atomic Force Microscopy -- Tip-Enhanced Spectroscopy for Nano Investigation of Molecular Vibrations -- Investigating Individual Carbon Nanotube/Polymer Interfaces with Scanning Probe Microscopy
Dimensions
unknown
Edition
1st ed. 2007.
Extent
1 online resource (378 p.)
Form of item
online
Isbn
9783540373193
Media category
computer
Media type code
  • c
Other control number
10.1007/11776314
Specific material designation
remote
System control number
  • (CKB)1000000000284167
  • (EBL)603603
  • (OCoLC)84895503
  • (SSID)ssj0000768118
  • (PQKBManifestationID)12387796
  • (PQKBTitleCode)TC0000768118
  • (PQKBWorkID)10758410
  • (PQKB)11517815
  • (SSID)ssj0000316289
  • (PQKBManifestationID)11246730
  • (PQKBTitleCode)TC0000316289
  • (PQKBWorkID)10263470
  • (PQKB)11755713
  • (DE-He213)978-3-540-37319-3
  • (MiAaPQ)EBC603603
  • (EXLCZ)991000000000284167

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