Coverart for item
The Resource Advanced characterization techniques for optics, semiconductors, and nanotechnologies : 3-5 August 2003, San Diego, California, USA, Angela Duparré, Bhanwar Singh, chairs/editors ; sponsored and published by SPIE--the International Society for Optical Engineering

Advanced characterization techniques for optics, semiconductors, and nanotechnologies : 3-5 August 2003, San Diego, California, USA, Angela Duparré, Bhanwar Singh, chairs/editors ; sponsored and published by SPIE--the International Society for Optical Engineering

Label
Advanced characterization techniques for optics, semiconductors, and nanotechnologies : 3-5 August 2003, San Diego, California, USA
Title
Advanced characterization techniques for optics, semiconductors, and nanotechnologies
Title remainder
3-5 August 2003, San Diego, California, USA
Statement of responsibility
Angela Duparré, Bhanwar Singh, chairs/editors ; sponsored and published by SPIE--the International Society for Optical Engineering
Contributor
Subject
Genre
Language
eng
Member of
Cataloging source
CUS
Illustrations
illustrations
Index
index present
Literary form
non fiction
Nature of contents
bibliography
http://library.link/vocab/relatedWorkOrContributorName
  • Duparré, Angela
  • Singh, Bhanwar
  • Society of Photo-optical Instrumentation Engineers
Series statement
SPIE proceedings series,
Series volume
v. 5188
http://library.link/vocab/subjectName
  • Optoelectronics
  • Optoelectronic devices
  • Optical measurements
  • Semiconductors
  • Thin films
  • Nanotechnology
Label
Advanced characterization techniques for optics, semiconductors, and nanotechnologies : 3-5 August 2003, San Diego, California, USA, Angela Duparré, Bhanwar Singh, chairs/editors ; sponsored and published by SPIE--the International Society for Optical Engineering
Instantiates
Publication
Note
"SPIE is an international technical society dedicated to advancing engineering and scientific applications of optical, photonic, imaging, electronic, and optoelectronic technologies."
Bibliography note
Includes bibliographical references and index
Dimensions
28 cm.
Extent
x, 402 p.
Isbn
9780819450616
Other physical details
ill.
System control number
  • 2136951-01okla_normanlaw
  • (SIRSI)2136951
  • (Sirsi) o53898281
  • (OCoLC)53898281
Label
Advanced characterization techniques for optics, semiconductors, and nanotechnologies : 3-5 August 2003, San Diego, California, USA, Angela Duparré, Bhanwar Singh, chairs/editors ; sponsored and published by SPIE--the International Society for Optical Engineering
Publication
Note
"SPIE is an international technical society dedicated to advancing engineering and scientific applications of optical, photonic, imaging, electronic, and optoelectronic technologies."
Bibliography note
Includes bibliographical references and index
Dimensions
28 cm.
Extent
x, 402 p.
Isbn
9780819450616
Other physical details
ill.
System control number
  • 2136951-01okla_normanlaw
  • (SIRSI)2136951
  • (Sirsi) o53898281
  • (OCoLC)53898281

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